The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 29, 2018

Filed:

Feb. 03, 2017
Applicant:

Marvin A. Biren, Chestnut Hill, MA (US);

Inventor:

Marvin A. Biren, Chestnut Hill, MA (US);

Assignee:

Other;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01C 19/64 (2006.01); G01B 9/02 (2006.01);
U.S. Cl.
CPC ...
G01C 19/64 (2013.01); G01B 9/02 (2013.01);
Abstract

Methods and apparatus optically measure acceleration, without Sagnac-effect corruption, without requiring slow light and without moving parts. Each optical accelerometer includes at least one measurement cell and at least one reference cell. Two optical signals traverse the cells in opposite directions around a figure-8-configured optical path and then interfere to produce an output signal. The reference cells have different indices of refraction than the measurement cells. Acceleration differentially affects speeds of the optical signals traversing the measurement and reference cells through differentially affecting the indices of refraction of the measurement and reference cells. These differences are evident in changes in the interference in the output signal, thereby enabling measurement of the acceleration. Several embodiments, including optical bench, vertical slab multi-pass, toroidal prism, planar waveguide, cylindrical waveguide, wound waveguide and optical fiber, are described.


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