The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 29, 2018

Filed:

Nov. 09, 2015
Applicant:

Hyundai Motor Company, Seoul, KR;

Inventor:

Jung Whan Yeum, Chungcheongbuk-do, KR;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/86 (2006.01); F16M 11/18 (2006.01); F16M 11/04 (2006.01); F16M 11/20 (2006.01); F16M 11/42 (2006.01);
U.S. Cl.
CPC ...
F16M 11/18 (2013.01); F16M 11/046 (2013.01); F16M 11/2085 (2013.01); F16M 11/2092 (2013.01); F16M 11/425 (2013.01); F16M 2200/08 (2013.01);
Abstract

An inspection apparatus includes an inspection unit for inspecting an inspection target, and a positioning unit for supporting the inspection target and positioning the inspection target to an inspection position.


Find Patent Forward Citations

Yeum, Jung. (2018). Inspection apparatus (U.S. Patent No. 9982833). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9982833

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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