The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 29, 2018

Filed:

Jan. 23, 2015
Applicant:

Hitachi, Ltd., Tokyo, JP;

Inventors:

Hisashi Takahashi, Tokyo, JP;

Taiga Goto, Tokyo, JP;

Koichi Hirokawa, Tokyo, JP;

Assignee:

HITACHI, LTD., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01K 1/12 (2006.01); A61B 6/00 (2006.01); A61B 6/03 (2006.01); G01N 23/04 (2018.01); G06T 11/00 (2006.01); G06T 7/00 (2017.01);
U.S. Cl.
CPC ...
A61B 6/5258 (2013.01); A61B 6/032 (2013.01); A61B 6/5205 (2013.01); G01N 23/046 (2013.01); G06T 7/0012 (2013.01); G06T 11/005 (2013.01); G06T 2207/10081 (2013.01);
Abstract

In order to provide a technique capable of restoring measured data from projection data with high accuracy and removing system noise included in the measured data, a signal processing device obtains measured data x including signal values of 0 or less by processing an output signal from a data acquisition system, and performs a conversion process on the measured data x by using a predefined function including a logarithmic function so as to generate projection data (logarithmically converted data z), in which the predefined function is a function of which an inverse function is present for values of a predetermined negative number s or more, and the measured data x including signal values of 0 or less within a predetermined range is restored from the projection data by applying the inverse function to the projection data.


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