The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 29, 2018
Filed:
May. 04, 2016
Adaptive Sensory Technology, Inc., San Diego, CA (US);
Michael Dorr, Munich, DE;
Luis A. Lesmes, San Diego, CA (US);
ADAPTIVE SENSORY TECHNOLOGY, INC., San Diego, CA (US);
Abstract
Disclosed herein are methods and systems of evaluating test-retest precision using fractional rank precision or mean-average precision, comprising: a) collecting a test and a retest result of each subject, wherein the results are described in feature space(s) and collected from a vision test machine; b) selecting, a first test result of a first subject; c) calculating distances from the first test result to the retest result of each subject; d) assessing, a similarity between the first test result and the retest result of each subject by ranking the distances in a non-descending order; e) assessing a rank precision for the first subject based on a rank of a distance from the first test result to the retest result of the first subject; f) repeating b), c), d), and e) for each subject; and evaluating, the test-retest precision based on the rank precision for each of the plurality of subjects.