The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 22, 2018

Filed:

Jul. 14, 2015
Applicant:

Canon Kabushiki Kaisha, Tokyo, JP;

Inventor:

Akinori Ohi, Toride, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 1/60 (2006.01); G06F 3/03 (2006.01); H04N 1/387 (2006.01); H04N 5/33 (2006.01); H04N 9/04 (2006.01); G06T 7/13 (2017.01); G06K 9/00 (2006.01); G06K 9/46 (2006.01);
U.S. Cl.
CPC ...
H04N 1/6005 (2013.01); G06F 3/0304 (2013.01); G06K 9/00201 (2013.01); G06K 9/00463 (2013.01); G06K 9/4604 (2013.01); G06K 9/4633 (2013.01); G06T 7/13 (2017.01); H04N 1/3873 (2013.01); H04N 5/33 (2013.01); H04N 9/045 (2013.01); G06F 2203/04101 (2013.01); G06T 2200/24 (2013.01); G06T 2207/10008 (2013.01); G06T 2207/30176 (2013.01); H04N 2201/0456 (2013.01);
Abstract

To specify a contour to be detected even when there are a plurality of candidates of the contour on the periphery of a photographing target, an image processing apparatus comprises: a determining unit which detects a plurality of candidate points being the candidates of the contour of a subject based on distance image information of the subject in an image, and determines an inspection-target area in the image based on the detected candidate points; and a specifying unit which detects line segments existing in the inspection-target area determined by the determining unit, based on luminance information of the inspection-target area, and specifies the line segment being the contour of the subject based on the candidate point from the detected line segments.


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