The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 22, 2018
Filed:
Dec. 02, 2014
Applicant:
Raytheon Company, Waltham, MA (US);
Inventors:
Thomas V. Sikina, Acton, MA (US);
Jack J. Schuss, Newton, MA (US);
Joseph C. Yeh, Brookline, MA (US);
Patrick J. Makridakis, Mendon, MA (US);
Assignee:
Raytheon Company, Waltham, MA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01Q 3/26 (2006.01); H01Q 1/28 (2006.01); H04B 7/145 (2006.01); H04B 17/12 (2015.01); H04B 17/14 (2015.01); H01Q 3/00 (2006.01);
U.S. Cl.
CPC ...
H01Q 3/267 (2013.01); H01Q 1/288 (2013.01); H04B 7/145 (2013.01); H04B 17/12 (2015.01); H04B 17/14 (2015.01);
Abstract
Methods and apparatus to calibrate an array by sequentially calibrating elements in a subarray with respect to each other using a satellite. The satellite is repeatedly illuminated for calibrating the elements using reference elements to determine plane fronts from which active elements can be calibrated with respect to each other.