The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 22, 2018

Filed:

Feb. 16, 2016
Applicants:

Boe Technology Group Co., Ltd., Beijing, CN;

Chengdu Boe Optoelectronics Technology Co., Ltd., Chengdu, Sichuan, CN;

Inventors:

Seungmin Lee, Beijing, CN;

Zhenrui Fan, Beijing, CN;

Wenxuan Zhang, Beijing, CN;

Assignees:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G03F 1/36 (2012.01); G03F 1/50 (2012.01); H01L 21/027 (2006.01); G03F 7/20 (2006.01); G02B 27/09 (2006.01); G03F 1/00 (2012.01);
U.S. Cl.
CPC ...
H01L 21/0274 (2013.01); G02B 27/0988 (2013.01); G03F 1/144 (2013.01); G03F 1/16 (2013.01); G03F 1/36 (2013.01); G03F 1/50 (2013.01); G03F 7/2016 (2013.01);
Abstract

The present invention belongs to the field of semiconductor technology, and specifically provides a photo mask and an exposure system. The photo mask is provided with a patterning structure for forming a resulting pattern, the patterning structure comprising a strip-like main body for forming a rectilinear pattern, wherein the patterning structure further comprises a patterning structure auxiliary unit provided at two sides of the strip-like main body, the patterning structure auxiliary unit being capable of adjusting and compensating direction and intensity of light during exposure. With the photo mask, the resulting pattern formed through exposure using the photo mask has improved fineness, thereby improving accuracy of the formed rectilinear pattern.


Find Patent Forward Citations

Loading…