The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 22, 2018

Filed:

Jul. 09, 2015
Applicant:

Toshiba Medical Systems Corporation, Otawara-shi, JP;

Inventors:

Seiichirou Nagai, Otawara, JP;

Yasuhiro Sugawara, Nasushiobara, JP;

Atsushi Kotani, Nasushiobara, JP;

Tsutomu Ichikawa, Yokohama, JP;

Toshikatsu Oohashi, Otawara, JP;

Shoji Yashiro, Nasushiobara, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H05G 1/64 (2006.01); G06T 11/20 (2006.01); G06F 19/00 (2018.01); G05B 15/02 (2006.01);
U.S. Cl.
CPC ...
G06T 11/206 (2013.01); G06F 19/3481 (2013.01); G16H 40/63 (2018.01); G05B 15/02 (2013.01);
Abstract

An exposure management system according to an embodiment includes a processing circuitry. The processing circuitry is configured to calculate a deviation index related to a difference between a target exposure index indicating an index of an exposure value that is set as a target of an X-ray image taking process and an image-taking-period exposure index indicating an index of an exposure value observed during the X-ray image taking process. The processing circuitry is configured to control so as to cause a display device to display history information from a predetermined time period indicating at least one selected from between image-taking-period exposure indices and deviation indices.


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