The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 22, 2018

Filed:

Nov. 06, 2015
Applicant:

Korea Advanced Institute of Science and Technology, Daejeon, KR;

Inventors:

Jong Chul Ye, Daejeon, KR;

Kyong Hwan Jin, Daejeon, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06T 11/00 (2006.01);
U.S. Cl.
CPC ...
G06T 11/008 (2013.01); G06T 2207/10081 (2013.01); G06T 2207/10088 (2013.01); G06T 2207/20021 (2013.01); G06T 2207/20024 (2013.01); G06T 2207/20048 (2013.01);
Abstract

A method and apparatus for reconstructing an image using a low rank Fourier interpolation scheme are provided. The method may reconstruct information of a k-space domain based on the information of the k-space domain using an imaging apparatus, for example, a magnetic resonance imaging (MRI) apparatus, a computed tomography (CT) apparatus, and a diffraction tomography apparatus. The method may generate a block Hankel matrix based on the information of the k-space domain, and may complete the block Hankel matrix using a low rank matrix completion algorithm, to reconstruct corresponding information of the k-space domain.


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