The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 22, 2018
Filed:
May. 19, 2015
Applicant:
Hitachi, Ltd., Tokyo, JP;
Inventors:
Takao Watanabe, Tokyo, JP;
Shigeki Mori, Tokyo, JP;
Ryo Imai, Tokyo, JP;
Koichi Watanabe, Tokyo, JP;
Assignee:
Hitachi, Ltd., Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B23K 26/53 (2014.01); G06K 15/12 (2006.01); G06K 1/12 (2006.01); B41M 3/00 (2006.01); G06K 15/02 (2006.01);
U.S. Cl.
CPC ...
G06K 15/1276 (2013.01); B23K 26/53 (2015.10); B41M 3/00 (2013.01); G06K 1/121 (2013.01); G06K 15/023 (2013.01); G06K 15/1271 (2013.01);
Abstract
It is an object of the present invention to improve visibility for observation with naked eyes or for camera shooting without spoiling the appearance during marking inside a transparent medium using a laser. By irradiating an inside of a transparent medium with a laser, the present invention forms a micro-denatured region in each of a first layer and a second layer inside the medium. The micro-denatured regions in the respective layers are arranged out of alignment with each other on a two-dimensional plane (refer to FIG.).