The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 22, 2018

Filed:

Oct. 03, 2011
Applicants:

Steven J. Simske, Fort Collins, CO (US);

Malgorzata M. Sturgill, Fort Collins, CO (US);

Matthew D. Gaubatz, Seattle, WA (US);

Masoud Zavarehi, Corvallis, OR (US);

Paul S. Everest, Albany, OR (US);

Inventors:

Steven J. Simske, Fort Collins, CO (US);

Malgorzata M. Sturgill, Fort Collins, CO (US);

Matthew D. Gaubatz, Seattle, WA (US);

Masoud Zavarehi, Corvallis, OR (US);

Paul S. Everest, Albany, OR (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06K 9/46 (2006.01); G06K 9/62 (2006.01); G06T 7/11 (2017.01);
U.S. Cl.
CPC ...
G06K 9/4671 (2013.01); G06K 9/6231 (2013.01); G06T 7/11 (2017.01); G06T 2207/10004 (2013.01);
Abstract

A method and apparatus to select from an image () of a first sample (), at least one region () digitally captured at a first resolution based upon how a counterfeit identification performance attribute of each region () digitally captured at the first resolution correlate to the counterfeit identification performance attribute of the region () digitally captured at a second resolution higher than the first resolution. The selected region () is used to determine whether the image () on a second sample is a counterfeit.


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