The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 22, 2018
Filed:
Jul. 06, 2012
Applicants:
Hiroshi Nakagawa, Kanagawa, JP;
Makoto Kamada, Kanagawa, JP;
Jin Maeda, Kanagawa, JP;
Inventors:
Assignee:
Daiichi Sankyo Company, Limited, Chuo-ku, JP;
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/50 (2006.01); A61K 31/444 (2006.01); G05B 15/02 (2006.01); G05B 17/02 (2006.01); A61J 3/00 (2006.01); G01N 33/15 (2006.01); A61K 9/28 (2006.01);
U.S. Cl.
CPC ...
G06F 17/5009 (2013.01); A61K 31/444 (2013.01); G05B 15/02 (2013.01); G05B 17/02 (2013.01); A61J 3/005 (2013.01); A61K 9/2853 (2013.01); G01N 33/15 (2013.01);
Abstract
A real-time release testing capable of constantly ensuring quality, a method for quality testing of a product using real-time release testing, a method for quality testing of an in-process product and/or an end product by real-time release testing, comprising the step of assessing the quality from design space established with only material attributes as inputs, and a manufacturing parameter-independent method for quality testing of a product using real-time release testing.