The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 22, 2018
Filed:
Dec. 29, 2015
Samsung Electronics Co., Ltd, Suwon-si, Gyeonggi-do, KR;
Moon-Su Kim, Gimpo-si, KR;
SAMSUNG ELECTRONICS CO., LTD., Suwon-si, Gyeonggi-Do, KR;
Abstract
A method of performing a static timing analysis on an integrated circuit includes loading a library that includes local random variation information of the integrated circuit and global variation information of the integrated circuit that is obtained based on a set of a plurality of global variation parameters of the integrated circuit, calculating delays of timing arcs included in the integrated circuit based on the library, and determining whether at least one timing path of a plurality of timing paths included in the integrated circuit violates a timing constraint based on the delays of the timing arcs in the at least one timing path, the local random variation information of the integrated circuit and the global variation information of the integrated circuit.