The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 22, 2018
Filed:
Mar. 30, 2011
David L. Hofeldt, Oakdale, MN (US);
Robert L. Brott, Woodbury, MN (US);
Daniel H. Carlson, Arden Hills, MN (US);
James N. Dobbs, Woodbury, MN (US);
Andrzej P. Jaworski, Woodbury, MN (US);
Glen A. Jerry, Roseville, MN (US);
John T. Strand, Stillwater, MN (US);
Michael J. Sykora, New Richmond, WI (US);
Karl K. Stensvad, Inver Grove Heights, MN (US);
David L. Hofeldt, Oakdale, MN (US);
Robert L. Brott, Woodbury, MN (US);
Daniel H. Carlson, Arden Hills, MN (US);
James N. Dobbs, Woodbury, MN (US);
Andrzej P. Jaworski, Woodbury, MN (US);
Glen A. Jerry, Roseville, MN (US);
John T. Strand, Stillwater, MN (US);
Michael J. Sykora, New Richmond, WI (US);
Karl K. Stensvad, Inver Grove Heights, MN (US);
3M INNOVATIVE PROPERTIES COMPANY, St. Paul, MN (US);
Abstract
A manufacturing system includes a sensing system that provides high-resolution feedback for web guiding and tension control. The system may be especially useful for web material that is manufactured to include micro-replicated structures with micron size scale. A micro-replication station forms a pattern of micro-replicated lenses on a web material. The sensing system illuminates a measurement area on the web material and detects an angular distribution of light exiting a set of the micro-replicated lenses within the first measurement area. A control system that adjusts at least one process control parameter of the transport system based on the detected angular distribution.