The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 22, 2018
Filed:
Jul. 23, 2015
Hitachi, Ltd., Tokyo, JP;
Yushi Tsubota, Tokyo, JP;
Shinji Kurokawa, Tokyo, JP;
Keisuke Yamakawa, Tokyo, JP;
Yasutaka Konno, Tokyo, JP;
Shinichi Kojima, Tokyo, JP;
Fumito Watanabe, Tokyo, JP;
Hitachi, Ltd., Tokyo, JP;
Abstract
Provided is a technique in an X-ray imaging apparatus for implementing data interpolation approximating an ideal point response trajectory interpolation, along with reducing calculation load. A method is provided to perform interpolation at high speed, in a direction along the point response trajectory. Sinograms are interpolated in advance from measured data, as to representative angles (e.g., 0°, ±30°, ±60°, and 90°) only. When a pixel targeted for back projection is determined at the time of reconstruction, a slope of the point response trajectory is determined as to each view. According to the slope of the trajectory, each representative sinogram is added with weight, whereby interpolation data in association with any angle can be obtained.