The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 22, 2018
Filed:
Sep. 11, 2013
Koninklijke Philips N.v., Eindhoven, NL;
Kay Nehrke, Hamburg, DE;
Peter Boernert, Hamburg, DE;
Johan Michiel Den Harder, Eindhoven, NL;
Thomas Hendrik Rozijn, Eindhoven, NL;
KONIKLIJKE PHILIPS N.V., Eindhoven, NL;
Abstract
The invention relates to a method of parallel MR imaging, wherein a reference scan is performed by means of a stimulated echo sequence including i) at least two preparation RF pulses (α) radiated toward a portion of a body () during a preparation period (), and ii) one or more reading RF pulses (β) radiated toward the portion of the body () during an acquisition period () temporally subsequent to the preparation period (). One or more FID signals (I) and one or more stimulated echo signals (I) are acquired during the acquisition period (). The spatial receive and/or—if applicable—transmitsensitivity profiles of at least two RF coils () are derived from the acquired FID signals (I) and/or from the acquired stimulated echo signals (I). The parameters of the stimulated echo sequence are selected such that it is robust against susceptibility-induced artifacts. Moreover,the invention relates to a MR device () and to a computer program for a MR device ().