The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 22, 2018

Filed:

Aug. 18, 2017
Applicant:

Melexis Technologies N.v., Tessenderlo, BE;

Inventors:

Johan Raman, Knesselare, BE;

Pieter Rombouts, Mariakerke, BE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 27/28 (2006.01); G01R 31/00 (2006.01); G01R 31/28 (2006.01); G01L 9/12 (2006.01); G01L 9/06 (2006.01); G01L 9/02 (2006.01); G01L 1/22 (2006.01); G01L 1/14 (2006.01); G01L 9/04 (2006.01);
U.S. Cl.
CPC ...
G01R 31/003 (2013.01); G01L 1/144 (2013.01); G01L 1/2262 (2013.01); G01L 9/02 (2013.01); G01L 9/04 (2013.01); G01L 9/06 (2013.01); G01L 9/12 (2013.01); G01R 31/2829 (2013.01);
Abstract

A difference measurement circuit having a first port and a second port for connection to a first set of nodes and a second set of nodes of a sensor unit. The circuit further has switching units for switching excitation signals emanating from excitation nodes from being applied to the first set of nodes (A, B) via the first port to being applied to the second set of nodes via the second port and for switching differential measurement signals measured at sensing nodes from being obtained from the second set of nodes via the second port to being obtained from the first set of nodes via the first port. The circuit further includes redundancy testing circuitry for evaluating the similarity or deviation between measurement signals obtained in different states of the switching units.


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