The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 22, 2018
Filed:
Oct. 09, 2014
Cnr—consiglio Nazionale Delle Ricerche, Rome, IT;
Leda Srl, Laboratorio Di Elettrodinamica Avanzata, Cassino, IT;
Gianluca Gagliardi, Pozzuoli, IT;
Fabrizio Marignetti, Naples, IT;
CNR—CONSIGLIO NAZIONALE DELLE RICERCHE, Cassino, IT;
Abstract
A method for measuring an alternating electric field is disclosed. The method includes realizing a first diffraction grating in a first location, in a core of a silica-based optical fiber, and measuring a peak reflection wavelength of the first diffraction grating. The method also includes positioning the optical fiber along a direction having a non-zero component of an electrical field generated by an alternating voltage to be measured, and coupling a substantially monochromatic light to said optical fiber surrounded by the electric field. The method further includes measuring a parameter dependent on a shift of the peak reflection wavelength due to intrinsic mechanical deformation or refractive index change of the material in which the optical fiber and the diffracting grating are realized due to the alternating electric field, and calculating a value of the electric field causing such a measured deformation or refractive index change.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile