The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 22, 2018
Filed:
Jan. 13, 2015
Applicant:
Fluke Corporation, Everett, WA (US);
Inventor:
John M. Gilbert, Seattle, WA (US);
Assignee:
Fluke Corporation, Everett, WA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 27/416 (2006.01); G01R 1/04 (2006.01); G01R 19/00 (2006.01); G01R 15/14 (2006.01); G01R 15/18 (2006.01);
U.S. Cl.
CPC ...
G01R 1/0416 (2013.01); G01R 15/148 (2013.01); G01R 15/181 (2013.01); G01R 15/183 (2013.01); G01R 19/0092 (2013.01);
Abstract
A testing device measures a characteristic of an electrical conductor. The testing device includes a substrate having at least one flexible portion, at least one sensor located on the substrate, and a holding mechanism. The at least one sensor is configured to generate a signal indicative of the characteristic of the electrical conductor. The holding mechanism is configured to hold the testing device to an outer portion of the electrical conductor such that the at least one sensor is held in a position with respect to the electrical conductor.