The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 22, 2018
Filed:
Nov. 07, 2014
The Boeing Company, Chicago, IL (US);
Jeffrey R. Kollgaard, Seattle, WA (US);
William J. Tapia, Graham, WA (US);
The Boeing Company, Chicago, IL (US);
Abstract
Disclosed is an apparatus, method and system for inspecting structures, and more particularly for evaluating the condition of a structure. The disclosed nondestructive inspection testing method and apparatus enables an operator to assess the condition of a structure, such as a composite laminate part and determining the location and depth of anomalies. The method includes generating a subsurface longitudinal ultrasonic wave signal at a high incidence angle into a structure being evaluated and collecting at least one of any front, back or side reflected wave data. The method may include processing the reflected wave data to determine the condition of the structure, including any anomalies that may have been detected and their location, size and shape.