The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 22, 2018
Filed:
Mar. 27, 2014
Applicant:
Snecma, Paris, FR;
Inventors:
William Bense, Melun, FR;
Valerio Gerez, Yerres, FR;
Assignee:
SNECMA, Paris, FR;
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 21/88 (2006.01); G01N 25/72 (2006.01); G01N 29/44 (2006.01); G06T 7/00 (2017.01); G01J 5/00 (2006.01); G01J 5/10 (2006.01); G01N 29/04 (2006.01);
U.S. Cl.
CPC ...
G01N 21/8851 (2013.01); G01J 5/0022 (2013.01); G01J 5/10 (2013.01); G01N 25/72 (2013.01); G01N 29/043 (2013.01); G01N 29/4409 (2013.01); G06T 7/0004 (2013.01); G01J 2005/0077 (2013.01); G01J 2005/0081 (2013.01); G01N 2021/8887 (2013.01); G01N 2291/0289 (2013.01); G01N 2291/044 (2013.01); G01N 2291/2693 (2013.01); G01N 2291/2694 (2013.01); G06T 2207/20021 (2013.01); G06T 2207/30164 (2013.01);
Abstract
A system and method for detecting defects on an object including forming an image representing the object from signals relating to the object, constructing subdivisions of the image according to auto-adaptive resolutions, and calculating differentials between various subdivisions in order to detect an abnormal subdivision indicating incipient failure.