The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 22, 2018

Filed:

Jul. 07, 2015
Applicant:

Sony Corporation, Tokyo, JP;

Inventors:

Tomohiko Nakamura, Tokyo, JP;

Junji Kajihara, Tokyo, JP;

Assignee:

SONY CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C12Q 1/68 (2018.01); G01N 21/64 (2006.01); B01L 7/00 (2006.01); G01N 21/03 (2006.01);
U.S. Cl.
CPC ...
G01N 21/6486 (2013.01); B01L 7/52 (2013.01); C12Q 1/68 (2013.01); C12Q 1/6816 (2013.01); G01N 21/0332 (2013.01); G01N 21/6408 (2013.01); G01N 2201/062 (2013.01); G01N 2201/06113 (2013.01);
Abstract

There is provided a base sequence analysis method including: a nucleic acid amplification procedure of obtaining an amplification product by a nucleic acid amplification reaction, a turbidity measurement procedure of measuring turbidity of a reaction solution of the nucleic acid amplification reaction; and a melting curve analysis procedure of performing melting curve analysis of a probe nucleic acid chain and the amplification product at a reaction site of the nucleic acid amplification reaction. This base sequence analysis method makes it possible to consecutively perform a nucleic acid amplification reaction and melting curve analysis at the same reaction site.


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