The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 22, 2018
Filed:
Oct. 07, 2015
Aston University, Birmingham, West Midlands, GB;
Lin Zhang, Birmingham, GB;
Zhijun Yan, Birmingham, GB;
Kaiming Zhou, Birmingham, GB;
Mehmet Aytun Erdentug, Broadway, GB;
ASTON UNIVERSITY, Birmingham, West Midlands, GB;
Abstract
Embodiments of the invention comprise apparatus and methods for detecting the presence of a substance in a test material using a plurality of wavelength-specific couplers (e.g. tilted fiber gratings) which provide a spatially distributed multi-node all-optical measurement system. Each node of the measurement system can comprise an optical module that is sensitive to the intensity of a limited band of wavelengths. The node is thus capable of detecting the presence of an absorption peak in a spectrum without having to obtain the full spectrum. By providing a plurality of optical modules that are sensitive to different wavelengths, the spectral signature of different substances may be monitored without having to measure full spectra. The measurement system may be particularly useful in a process control environment where it is desirable to take measurements of one or more substances in different locations.