The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 22, 2018
Filed:
Jul. 14, 2014
Perkinelmer Singapore Pte Limited, Singapore, SG;
Ralph Lance Carter, Thame, GB;
Robert Alan Hoult, Beaconsfield, GB;
PerkinElmer Singapore PTE Limited, Singapore, SG;
Abstract
Diffuse reflectance spectroscopy apparatus for use in analyzing a sample comprising a sample receiving location () for receiving a sample () for analysis; an illumination arrangement () for directing light towards a received sample; a detector () for detecting light reflected by a received sample; and collection optics () for directing light reflected by a received sample towards the detector. The illumination arrangement further comprises an interferometer () and a half beam block () which is disposed substantially at a focus in the optical path for blocking light which exits the interferometer, passes said focus, and is reflected from reentering the interferometer. A half beam block () may be disposed in the optical path between the interferometer and the light source () for blocking light that exits the interferometer back towards the light source and is reflected by the light source from re-entering the interferometer and/or a half beam block () may be disposed in the optical path on the opposite side of the interferometer than the light source.