The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 22, 2018

Filed:

Oct. 16, 2015
Applicant:

Kidde Technologies Inc., Wilson, NC (US);

Inventor:

Aaron Stanley Rogers, Surf City, NC (US);

Assignee:

Kidde Technologies, Inc., Wilson, NC (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 29/07 (2006.01); G01M 3/00 (2006.01);
U.S. Cl.
CPC ...
G01M 3/002 (2013.01);
Abstract

A linear-thermal-sensor testing system has a signal generator and a reflection analyzer. The signal generator generates a series of damped sinusoidal impulse signals each of a different frequency, and transmits the damped sinusoidal impulse signals to a first end of the linear thermal sensor. The linear thermal sensor generates a reflection signal corresponding to each of series the damped sinusoidal impulse signals at a plurality of electrical discontinuities in the linear thermal sensing array. The reflection analyzer receives a reflection signal from the first end of the linear thermal sensor. The reflection signal has indicia of electrical properties and locations within the linear thermal sensor for each of the plurality of electrical discontinuities. The reflection analyzer calculates the electrical properties and the locations within the linear thermal sensor based on the indicia of the received reflection signal.


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