The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 22, 2018
Filed:
Jun. 29, 2016
Beam Engineering for Advanced Materials Co., Orlando, FL (US);
Nelson V. Tabirian, Winter Park, FL (US);
Zhi J. Liao, Apopka, FL (US);
Beam Engineering for Advanced Measurements Co., Orlando, FL (US);
Abstract
Sensors, devices, apparatus, systems and methods for replacing microlens arrays with one or more switchable diffractive waveplate microlens arrays for providing measurements of wavefronts and intensity distribution in light beams with high spatial resolution with a single optical radiation sensor. The device acts like a conventional Shack-Hartmann wavefront sensor when the microlens array elements are in focusing state, and the device performs light beam intensity profile characterization acting as a beam profiler when the optical power of lens array elements is switched off.