The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 22, 2018
Filed:
Apr. 20, 2015
Konica Minolta, Inc., Tokyo, JP;
Yosuke Takebe, Osaka, JP;
Yoshihisa Abe, Osaka, JP;
Konica Minolta, Inc., Tokyo, JP;
Abstract
Since both gloss and a reflection characteristic are measured by one surface characteristic measurement device, a gloss measurement target area and a reflection characteristic measurement target area are appropriately set. A gloss measurement instrument and a color measurement instrument are integrated with a gloss colorimeter. The gloss measurement instrument illuminates an illumination target face by illumination light, receives reflected light generated by a regular reflection of the illumination light on the illumination target face, and outputs a measurement result for the reflected light. A size of the gloss measurement target area can be changed. The color measurement instrument illuminates the illumination target face by annular illumination light, receives reflected light generated by a reflection of the annular illumination light on the illumination target face, and outputs a measurement result for the reflected light. A size of the reflection characteristic measurement target area can be changed.