The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 22, 2018
Filed:
May. 22, 2017
Applicant:
J.a. Woollam Co., Inc., Lincoln, NE (US);
Inventors:
Stefan Schoeche, Lincoln, NE (US);
Jeremy A. Van Derslice, Lincoln, NE (US);
Jeffrey S. Hale, Lincoln, NE (US);
Craig M. Herzinger, Lincoln, NE (US);
Assignee:
J.A. WOOLAM CO., INC., Lincoln, NE (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 4/00 (2006.01); G01J 3/447 (2006.01); G06F 17/17 (2006.01); G01J 4/04 (2006.01); G01N 21/21 (2006.01); G06G 7/30 (2006.01); G03F 7/004 (2006.01); G06F 17/12 (2006.01); G06F 17/18 (2006.01); G06K 15/22 (2006.01);
U.S. Cl.
CPC ...
G01J 3/447 (2013.01); G01J 4/04 (2013.01); G01N 21/211 (2013.01); G06F 17/17 (2013.01); G06F 17/175 (2013.01); G06G 7/30 (2013.01); G01N 2021/213 (2013.01); G03F 7/0042 (2013.01); G06F 17/12 (2013.01); G06F 17/18 (2013.01); G06K 15/225 (2013.01);
Abstract
Methodology of characterizing pore size and distribution in a porous thin film having a surface, or in a surface region of a porous semi-infinite bulk substrate having a surface, involving applying a mathematical model of a sample based on a Bruggerman effective medium.