The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 22, 2018

Filed:

Jun. 17, 2016
Applicant:

Seiko Epson Corporation, Tokyo, JP;

Inventor:

Teruyuki Nishimura, Matsumoto, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/25 (2006.01); G01J 3/02 (2006.01); G01J 3/26 (2006.01); G01J 3/51 (2006.01); G03G 15/01 (2006.01); G02B 26/00 (2006.01); H04N 1/60 (2006.01);
U.S. Cl.
CPC ...
G01J 3/021 (2013.01); G01J 3/26 (2013.01); G01J 3/51 (2013.01); G02B 26/001 (2013.01); G03G 15/01 (2013.01); H04N 1/6033 (2013.01); H04N 1/6044 (2013.01);
Abstract

A printer includes a spectroscope that includes a wavelength-selective interference filter on which light from a measurement target is incident and a carriage moving unit that moves the spectroscope in an X direction with respect to the measurement target. The wavelength-selective interference filter includes a pair of reflecting films and an electrostatic actuator that changes a gap dimension between the pair of reflecting films. A first spectroscopic measurement process that performs spectroscopic measurement while the gap dimension between the reflecting films is decreasing and a second spectroscopic measurement process that performs spectroscopic measurement while the gap dimension is increasing are alternately performed during the movement of the spectroscope by the carriage moving unit in the X direction.


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