The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 22, 2018
Filed:
Sep. 16, 2015
Finetek Co., Ltd., New Taipei, TW;
Shyh-Jong Chung, New Taipei, TW;
I-Chu Lin, New Taipei, TW;
Liang-Chi Chang, New Taipei, TW;
Chao-Kai Cheng, New Taipei, TW;
Yi-Liang Hou, New Taipei, TW;
FINETEK CO., LTD., New Taipei, TW;
Abstract
A method for measuring a permittivity (ε) of a material () includes following steps. A sensing rod () of a material level sensor () inserts into a tank (). The material level sensor () proceeds with a material level measurement of the material () to obtain a first feature value. The material level sensor () is vertically moved with a vertical distance (Hair). The material level sensor () proceeds with the material level measurement to obtain a second feature value, and subtracts the first feature value by the second feature value to obtain a feature value variation, and calculates the feature value variation to obtain the permittivity (ε) of the material ().