The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 22, 2018

Filed:

Mar. 15, 2013
Applicant:

United Technologies Corporation, Hartford, CT (US);

Inventors:

Joseph D. Drescher, Middletown, CT (US);

Erik M. Pedersen, Cheshire, CT (US);

Assignee:

United Technologies Corporation, Farmington, CT (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 21/00 (2006.01); G01B 11/00 (2006.01); G01N 21/88 (2006.01); G01N 21/956 (2006.01);
U.S. Cl.
CPC ...
G01B 21/00 (2013.01); G01B 11/00 (2013.01); G01N 21/8806 (2013.01); G01N 21/95692 (2013.01);
Abstract

Inspecting features of an object including measuring features of the master part that represents a desired nominal dimensions to obtain a preliminary set of dimensional data. The preliminary set of data becomes a master data set. The same master part is measured on a second machine to obtain another set of data on the master part. The two data sets are compared and correction data is generated representing differences between the different data sets for the same master part measured on different machines. Subsequent parts are then measured on the second machine to obtain measurement data that is corrected based on the correction data. The application of the correction information provides for the use of 5-axis machines within a desired measurement capability.


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