The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 22, 2018
Filed:
Sep. 04, 2014
Bae Systems Plc, London, GB;
Craig Daniel Stacey, Bristol, GB;
Jeffrey Paul Sargent, Bristol, GB;
BAE SYSTEMS plc, London, GB;
Abstract
An optical surface roughness measurement-enabling arrangement and method are disclosed for enabling measurement of the surface roughness of a material. The arrangement comprises an optical radiation source for generating a beam of collimated radiation along a first axis for illuminating the surface of the material with the radiation directed along the first axis, a refractive optical element optically alignable with the beam of radiation for refracting the beam along a second axis which is non-parallel with the first axis, for illuminating the surface of the material with the radiation directed along the second axis and a detector which is arranged to detect the radiation, incident upon the surface along the first axis and second axis, which becomes reflected off the surface of the material. An optical surface roughness measuring arrangement and method are also disclosed for providing a measurement value of the surface roughness.