The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 22, 2018

Filed:

Jan. 23, 2013
Applicant:

Karlsruher Institut Für Technologie, Karlsruhe, DE;

Inventors:

Christian Koos, Siegelsbach, DE;

Claudius Weimann, Oppenweiler, DE;

Juerg Leuthold, Walzbachtal, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01P 3/36 (2006.01); G01B 9/02 (2006.01); G01S 17/87 (2006.01); G01B 11/02 (2006.01); G01B 11/00 (2006.01); G01B 11/14 (2006.01);
U.S. Cl.
CPC ...
G01B 9/02008 (2013.01); G01B 9/02003 (2013.01); G01B 11/005 (2013.01); G01B 11/026 (2013.01); G01B 11/14 (2013.01); G01P 3/36 (2013.01); G01P 3/366 (2013.01); G01S 17/87 (2013.01);
Abstract

The invention relates to a method and a corresponding apparatus for measuring distance and optionally speed, in particular for multiscale distance measurement. The method comprises generating a first and a second frequency comb signal (), wherein the first and second frequency comb signals () have different line spacings; a reference measurement comprising superimposing the at least one part of the first frequency comb signal () and at least one part of the second frequency comb signal () in a reference beam path () and detecting the superimposition signal propagated by the reference beam path; a first measurement comprising superimposing at least one part of the second frequency comb signal () on the at least one part of the first frequency comb signal (), injecting the superimposition signal into a measurement beam path () and detecting the superimposition signal propagated by the measurement beam path; and determining the path difference between the reference beam path () and the measurement beam path () from the detected superimposition signals.


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