The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 22, 2018

Filed:

Aug. 17, 2016
Applicants:

W. Davis Lee, Newburyport, MA (US);

Mark R. Amato, South Hamilton, MA (US);

Stephen L. Spotts, Argyle, TX (US);

James P. Bennett, Birmingham, AL (US);

Inventors:

W. Davis Lee, Newburyport, MA (US);

Mark R. Amato, South Hamilton, MA (US);

Stephen L. Spotts, Argyle, TX (US);

James P. Bennett, Birmingham, AL (US);

Assignee:

Other;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61N 5/00 (2006.01); A61N 5/10 (2006.01); A61B 6/03 (2006.01); G21K 1/093 (2006.01); G21K 5/04 (2006.01); A61B 6/00 (2006.01); G01N 23/04 (2018.01); A61B 6/04 (2006.01);
U.S. Cl.
CPC ...
A61N 5/1069 (2013.01); A61B 6/03 (2013.01); A61B 6/032 (2013.01); A61B 6/4014 (2013.01); A61B 6/4092 (2013.01); A61B 6/4258 (2013.01); A61B 6/4266 (2013.01); A61B 6/4417 (2013.01); A61B 6/4435 (2013.01); A61B 6/5247 (2013.01); A61N 5/1037 (2013.01); A61N 5/1039 (2013.01); A61N 5/1067 (2013.01); A61N 5/1077 (2013.01); A61N 5/1082 (2013.01); G01N 23/046 (2013.01); G21K 1/093 (2013.01); G21K 5/04 (2013.01); A61B 6/0457 (2013.01); A61B 6/5205 (2013.01); A61N 5/107 (2013.01); A61N 2005/105 (2013.01); A61N 2005/1054 (2013.01); A61N 2005/1061 (2013.01); A61N 2005/1087 (2013.01); A61N 2005/1095 (2013.01); A61N 2005/1097 (2013.01); G01N 2223/107 (2013.01); G01N 2223/203 (2013.01);
Abstract

A scintillation material is longitudinally packaged in a circumferentially surrounding sheath, where the sheath has a lower index of refraction than the scintillation material, to form a scintillation optic or scintillation fiber optic. The scintillation material yields secondary photons upon passage of a charged particle beam, such as a positively charged residual particle beam having transmitted through a sample. The internally generated secondary photons within the sheath are guided to a detector element by the difference in index of refraction. Multiple scintillation optics are assembled to form a two-dimensional scintillation array coupled to a two-dimensional detector array, such as for use in determination of state of the residual charged particle beam, determination of an exit point of the particle beam from the sample, path of the treatment beam, and/or tomographic imaging.


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