The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 22, 2018
Filed:
Oct. 17, 2014
Essilor International (Compagnie Generale D'optique), Charenton-le-pont, FR;
Ahmed Haddadi, Charenton-le-pont, FR;
Marie-Anne Berthezene, Charenton-le-pont, FR;
Isabelle Poulain, Charenton-le-pont, FR;
Cecile Petignaud, Charenton-le-pont, FR;
Loic Levraud, Charenton-le-pont, FR;
Sebastien Gayat, Charenton-le-pont, FR;
Fabien Divo, Charenton-le-pont, FR;
Benjamin Rousseau, Charenton-le-pont, FR;
ESSILOR INTERNATIONAL (COMPAGNIE GENERAL D'OPTIQUE), Charenton-le-Pont, FR;
Abstract
A quality control method for optometric measurements includes the following steps: (a) recording, via computer, a first record () that includes at least one first value of a first identifier (), enabling identification of a glasses wearer (), and at least one other value of another identifier () enabling identification of an optometric apparatus () on a first optometric measuring site (); (b) carrying out at least one optometric measurement () of the wearer; (c) sending, to a second site (), a digital measurement data set () including the optometric measurement result from step (b), the digital data set being linked, via computer, to the first record; and (d) digitally processing the optometric measurement result from the first record () on the basis of a digital data reference system () and the values of the respective identifiers of the glasses wearer and the optometric apparatus of the first record.