The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 15, 2018

Filed:

Apr. 05, 2016
Applicant:

Infineon Technologies Ag, Neubiberg, DE;

Inventors:

Ulf Bartl, Villach, AT;

Alfons Dehe, Reutlingen, DE;

Assignee:

INFINEON TECHNOLOGIES AG, Neubiberg, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04R 23/00 (2006.01); B81C 1/00 (2006.01); G02B 5/18 (2006.01); G02B 27/42 (2006.01); H04R 31/00 (2006.01);
U.S. Cl.
CPC ...
H04R 23/008 (2013.01); B81C 1/00158 (2013.01); G02B 5/1814 (2013.01); G02B 27/4233 (2013.01); H04R 31/003 (2013.01); H04R 23/00 (2013.01); H04R 2201/003 (2013.01); H04R 2207/021 (2013.01);
Abstract

According to an embodiment, an optical MEMS transducer includes a diffraction structure including alternating first reflective elements and openings arranged in a first plane, a reflection structure including second reflective elements and configured to deflect with respect to the diffraction structure, and an optical element configured to direct a first optical signal at the diffraction structure and the reflection structure and to receive a second optical signal from the diffraction structure and the reflection structure. The second reflective elements are arranged in the first plane when the reflection structure is at rest. Other embodiments include corresponding systems and apparatus, each configured to perform various embodiment methods.


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