The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 15, 2018
Filed:
Feb. 18, 2016
Fujifilm Corporation, Tokyo, JP;
Yasutake Tanaka, Ashigarakami-gun, JP;
Yasunori Ohta, Ashigarakami-gun, JP;
FUJIFILM Corporation, Tokyo, JP;
Abstract
Disclosed is an imaging device and method capable of obtaining an image with exposure appropriate for each sample when a plurality of samples are collectively imaged. For performing imaging using an imaging device configured to divide an imaging area into a plurality of partial areas, to perform imaging for each partial area, a proper exposure time is calculated for each partial area based on an image signal, a positive integer multiple of the maximum value among the calculated proper exposure times is set as a total imaging time, an imaging frequency is set for each partial area using a value obtained by dividing the total imaging time by the calculated proper exposure time, imaging with the calculated proper exposure time of the partial area is successively and repeatedly performed by the set imaging frequency, and each image successively imaged is simply added or is added and averaged.