The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 15, 2018
Filed:
Aug. 30, 2013
Applicant:
Zte Corporation, Shenzhen, CN;
Inventors:
Xiaojing Jin, Shenzhen, CN;
Dezhi Zhang, Shenzhen, CN;
Assignee:
ZTE CORPORATION, Shenzhen, CN;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04B 10/071 (2013.01); H04B 10/077 (2013.01); H04Q 11/00 (2006.01); G01M 11/00 (2006.01);
U.S. Cl.
CPC ...
H04B 10/071 (2013.01); G01M 11/3145 (2013.01); H04B 10/0771 (2013.01); H04B 10/0773 (2013.01); H04Q 11/0067 (2013.01); H04Q 2011/0083 (2013.01);
Abstract
Provided are a method and device for configuring an OTDR test parameter set. The above-mentioned method comprises: an FMS acquiring related information about an ODN according to a test result fed back by an OTDR; and the FMS configuring a test parameter set required for one or more subsequent OTDR tests according to the related information. According to the technical solution provided in the disclosure, the test parameter set required for initiating an OTDR test can be accurately acquired.