The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 15, 2018

Filed:

Jul. 27, 2017
Applicant:

Renesas Electronics Corporation, Tokyo, JP;

Inventors:

Soshi Kuroda, Tokyo, JP;

Tatsuya Kobayashi, Tokyo, JP;

Takanori Aoki, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 29/76 (2006.01); H01L 23/31 (2006.01); H01L 23/00 (2006.01); H01L 23/498 (2006.01); H01L 29/06 (2006.01); H01L 23/58 (2006.01); H01L 23/535 (2006.01); H01L 21/66 (2006.01); H01L 23/29 (2006.01); H01L 21/78 (2006.01); H01L 21/56 (2006.01);
U.S. Cl.
CPC ...
H01L 23/3128 (2013.01); H01L 21/565 (2013.01); H01L 21/78 (2013.01); H01L 22/32 (2013.01); H01L 23/293 (2013.01); H01L 23/3135 (2013.01); H01L 23/49838 (2013.01); H01L 23/535 (2013.01); H01L 23/585 (2013.01); H01L 24/06 (2013.01); H01L 24/32 (2013.01); H01L 24/48 (2013.01); H01L 24/73 (2013.01); H01L 24/83 (2013.01); H01L 24/85 (2013.01); H01L 24/92 (2013.01); H01L 29/0649 (2013.01); H01L 24/29 (2013.01); H01L 2224/04042 (2013.01); H01L 2224/05082 (2013.01); H01L 2224/05124 (2013.01); H01L 2224/05144 (2013.01); H01L 2224/05147 (2013.01); H01L 2224/06135 (2013.01); H01L 2224/29014 (2013.01); H01L 2224/29015 (2013.01); H01L 2224/2919 (2013.01); H01L 2224/30183 (2013.01); H01L 2224/45147 (2013.01); H01L 2224/73265 (2013.01); H01L 2224/83201 (2013.01); H01L 2224/92247 (2013.01); H01L 2924/0665 (2013.01); H01L 2924/10161 (2013.01); H01L 2924/10253 (2013.01); H01L 2924/13091 (2013.01);
Abstract

To provide a semiconductor device having improved reliability. The semiconductor device has a wiring board, bonding land, semiconductor chip mounted on the wiring board via an adhesive layer and having a pad electrode, bonding wire connecting the pad electrode with the bonding land, and sealing body. The sealing body is, in a circuit formation region, in contact with an organic protection film and, in a scribe region and a region between the pad electrode and the scribe region, in contact with a surface protection film while not in contact with the organic protection film. A first side surface is closer to the circuit formation region side than a second one. The adhesive layer covers entirety of the semiconductor chip back surface and the second side surface of the semiconductor chip. The first side surface is in contact with the sealing body without being covered with the adhesive layer.


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