The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 15, 2018

Filed:

Oct. 02, 2015
Applicant:

Globalfoundries Inc., George Town, KY;

Inventors:

Edward J. Nowak, Essex Junction, VT (US);

Robert R. Robison, Colchester, VT (US);

Lyndon R. Logan, Poughkeepsie, NY (US);

Assignee:

GLOBALFOUNDRIES INC., George Town, KY;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H01L 31/062 (2012.01); H01L 29/66 (2006.01); G06F 17/50 (2006.01); H01L 21/66 (2006.01); H01L 27/088 (2006.01); G01B 7/00 (2006.01);
U.S. Cl.
CPC ...
H01L 22/34 (2013.01); G01B 7/00 (2013.01); H01L 22/32 (2013.01); H01L 27/0886 (2013.01);
Abstract

A source/drain epitaxial electrical monitor and methods of characterizing epitaxial growth through capacitance measurements are provided. The structure includes a plurality of fin structures; one or more gate structures, perpendicular to and intersecting the plurality of fin structures. The structure further includes a first connection by a first contact at one fin-end of every other fin structure of the plurality of fin structures, and a second connection by a second contact at one end of an alternate fin structure of the plurality of fin structures.


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