The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 15, 2018
Filed:
Apr. 10, 2015
Elwha Llc, Bellevue, WA (US);
Jeffrey A. Bowers, Bellevue, WA (US);
Peter L. Hagelstein, Carlisle, MA (US);
Roderick A. Hyde, Redmond, WA (US);
Muriel Y. Ishikawa, Livermore, CA (US);
Jordin T. Kare, San Jose, CA (US);
Lowell L. Wood, Jr., Bellevue, WA (US);
Victoria Y. H. Wood, Livermore, CA (US);
Elwha LLC, Bellevue, WA (US);
Abstract
Systems and methods for self-testing archival memory devices are described. The memory device includes a data storage component capable of being coded with data. The memory device further includes a read-write mechanism configured to read, write, and delete data stored on the data storage component. The memory device includes a read-write controller configured to control the read-write mechanism based on input received through a device interface of the memory device, wherein the device interface of the memory device is configured to connect to an external computing device. The memory device further includes a diagnostic controller configured to perform a test on at least one of the data stored on the data storage component, the data storage component, and the read-write mechanism. The memory device includes a power source configured to provide operational power to the diagnostic controller when the memory device is not connected to an external power source.