The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 15, 2018

Filed:

Sep. 30, 2016
Applicant:

Altera Corporation, San Jose, CA (US);

Inventors:

Bee Yee Ng, Bayan Lepas, MY;

Gaik Ming Chan, Butterworth, MY;

Ping-Chen Liu, Fremont, CA (US);

Thien Le, San Jose, CA (US);

Assignee:

Altera Corporation, San Jose, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G11C 7/10 (2006.01); G11C 5/06 (2006.01);
U.S. Cl.
CPC ...
G11C 7/10 (2013.01); G11C 5/06 (2013.01);
Abstract

Integrated circuits may include dual mode memory cells. Dual mode memory cells may be operated in a lookup-table mode or a memory mode. A dual mode memory cell may have configuration ports for supporting a configuration operation and user ports for supporting a user mode operation. When performing configuration operations in the memory mode, the configuration ports may be gated off to prevent existing user data from being accessed. Each column of memory cells may be arranged into groups. Each group of memory cells in a column may be connected to a respective local data line, which is connected to a global data line via a switch. The switch may be selectively activated to short the local data line to the global data line. Configured in this hierarchical data line architecture, leakage at the global data line can dramatically be reduced, and the memory cell read margin is improved.


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