The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 15, 2018

Filed:

Aug. 07, 2015
Applicant:

Lg Display Co., Ltd., Seoul, KR;

Inventor:

Jun Yeob Lee, Gyeongsan-si, KR;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02F 1/1343 (2006.01); G09G 3/00 (2006.01); G02F 1/13 (2006.01); G02F 1/1345 (2006.01); G02F 1/1362 (2006.01); G02F 1/1368 (2006.01);
U.S. Cl.
CPC ...
G09G 3/006 (2013.01); G02F 1/1309 (2013.01); G02F 1/1345 (2013.01); G02F 1/1368 (2013.01); G02F 1/136286 (2013.01); G02F 2001/136254 (2013.01);
Abstract

A liquid crystal display (LCD) device and a method for testing pixels of the LCD device are disclosed, in which pixels adjacent to each other vertically are arranged in a display area to share a gate line and an auto probe test pattern of the pixels is arranged in a non-display area. The LCD device comprises a plurality of pixels arranged in a display area; and a test pattern arranged in a non-display area, for supplying a test signal to each of the plurality of pixels, wherein two pixels, which are adjacent to each other vertically, among the plurality of pixels, share a single gate line and receive data voltages from different data lines different from each other, and the test pattern includes at least one data shorting bar and at least one switching unit to supply the test signal to each of the plurality of pixels per color.


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