The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 15, 2018

Filed:

Jul. 22, 2016
Applicant:

Infinitt Healthcare Co., Ltd., Seoul, KR;

Inventor:

Duy Hien Pham, Seoul, KR;

Assignee:

Other;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06T 7/00 (2017.01); G06K 9/46 (2006.01); G06K 9/52 (2006.01);
U.S. Cl.
CPC ...
G06T 7/0012 (2013.01); G06K 9/4604 (2013.01); G06K 9/4642 (2013.01); G06K 9/4661 (2013.01); G06K 9/52 (2013.01); G06T 7/0085 (2013.01); G06T 2207/20144 (2013.01); G06T 2207/30004 (2013.01);
Abstract

Disclosed is an image quality evaluation method for a digital pathology system according to the present invention. The image quality evaluation method includes receiving a digital slide image by an image quality evaluation unit; dividing the digital slide image into a plurality of blocks by the image quality evaluation unit; analyzing the plurality of blocks to extract a foreground; calculating a blur for the extracted foreground; calculating brightness distortion for the extracted foreground; calculating contrast distortion for the extracted foreground; and evaluating the overall quality of the digital slide image using the blur, the brightness distortion, and the contrast distortion by the image quality evaluation unit.


Find Patent Forward Citations

Pham, Duy. (2018). Method of determining image quality in digital pathology system (U.S. Patent No. 9972086). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9972086

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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