The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 15, 2018

Filed:

Apr. 21, 2014
Applicant:

Case Western Reserve University, Cleveland, OH (US);

Inventors:

Mark Griswold, Shaker Heights, OH (US);

Kechung Liu, Solon, OH (US);

Dan Ma, Cleveland, OH (US);

Tiejun Zhao, Pittsburgh, PA (US);

Assignee:

CASE WESTERN RESERVE UNIVERSITY, Cleveland, OH (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 33/565 (2006.01);
U.S. Cl.
CPC ...
G01R 33/56536 (2013.01); G01R 33/56563 (2013.01);
Abstract

Example apparatus and methods provide improved resolution over conventional magnetic resonance imaging (MRI) that is affected by the presence of metal (e.g., prosthetic hip) in the MRI field of view (FOV). Embodiments may excite a slice that is affected by a susceptibility effect produced by metal. Embodiments may excite the slice using a first pre-determined frequency and a plurality of scout frequency encodings. Embodiments may acquire nuclear magnetic resonance (NMR) signal data from the slice in response to the first pre-determined frequency and the plurality of scout frequency encodings and select frequency encodings to use to image the slice as a function of an amplitude of the NMR signal data. Frequency encodings are selected to produce data that will help account for distortions caused by the susceptibility effect.


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