The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 15, 2018

Filed:

Nov. 27, 2013
Applicant:

Sharp Kabushiki Kaisha, Osaka-shi, Osaka, JP;

Inventors:

Yuta Ikawa, Osaka, JP;

Ken Sumitani, Osaka, JP;

Tsuyoshi Ono, Osaka, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/44 (2006.01); H05B 33/08 (2006.01); G01R 31/26 (2014.01);
U.S. Cl.
CPC ...
G01R 31/44 (2013.01); H05B 33/0815 (2013.01); H05B 33/0827 (2013.01); H05B 33/0893 (2013.01); G01R 31/2635 (2013.01);
Abstract

To provide an electronic device that can detect an abnormality in an element with a simple configuration. An electronic deviceincludes: a first element string groupformed by at least one element stringtoconnected in parallel, the element stringtobeing formed by at least one element connected in series; a second element string groupformed by the element stringtobeing at least one in number and connected in parallel; and an abnormality detecting unitthat detects an abnormality in the element stringtoandtoforming at least one of the first element string groupand the second element string group, based on whether or not a first current Ibeing the sum of current flowing through the element stringtoforming the first element string groupand a second current Ibeing the sum of current flowing through the element stringtoforming the second element string groupsatisfy a prescribed relationship.


Find Patent Forward Citations

Loading…