The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 15, 2018

Filed:

Aug. 26, 2016
Applicant:

Infineon Technologies Ag, Neubiberg, DE;

Inventor:

Emanuele Bodano, Villach, AT;

Assignee:

Infineon Technologies AG, Neubiberg, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/3187 (2006.01); G01R 31/26 (2014.01); G01R 31/27 (2006.01);
U.S. Cl.
CPC ...
G01R 31/2621 (2013.01); G01R 31/27 (2013.01);
Abstract

In accordance with an embodiment, a circuit includes: a gate drive circuit; an output transistor, and a gate coupled to the gate drive circuit; a normally-on transistor including a load path coupled to the gate drive circuit and to the gate of the output transistor; and a pull-up device, where the output transistor is configured to provide a test leakage current in a test mode when a measurement voltage is applied to a current test node coupled to the gate of the output transistor and a turn-off voltage is applied to the gate of the normally-on transistor; and the gate drive circuit is configured to provide a gate drive voltage to the gate of the output transistor in a nominal operation mode when a voltage of the gate of the normally-on transistor is pulled-up to a voltage of the pull-up node via the pull-up device.


Find Patent Forward Citations

Bodano, Emanuele. (2018). Test circuit for stress leakage measurements (U.S. Patent No. 9970980). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9970980

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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