The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 15, 2018
Filed:
Nov. 04, 2014
Yeda Research and Development Co. Ltd., Rehovot, IL;
Nirit Dudovich, Rehovot, IL;
Oren Raz, Rehovot, IL;
Boaz Nadler, Rehovot, IL;
Dan Oron, Rehovot, IL;
YEDA RESEARCH AND DEVELOPMENT CO. LTD., Rehovot, IL;
Abstract
A method and system for use in reconstruction and retrieval of phase information associated with a two-dimensional diffractive response are presented. The method comprising: providing () input data indicative of one or more diffractive patterns corresponding to diffractive responses from one or more objects (). Dividing () said input data into a plurality of one-dimensional slices and determining () one-dimensional phase data for at least some of said one-dimensional slices. Tailoring () the reconstructed phase data of said one-dimensional slices to form a two-dimensional phase solution. The two-dimensional phase solution is defined by phase shifts of said reconstructed one-dimensional phase data of said one-dimensional slices. The two-dimensional phase solution thus enables obtaining two-dimensional reconstructed phase data suitable for reconstruction of image data ().