The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 15, 2018
Filed:
Nov. 29, 2011
Methods and systems for analyzing images of specimens processed by a programmable quantitative assay
Jesper Lohse, Herlev, DK;
Hans Christian Pedersen, Hillerod, DK;
Joachim Schmid, Santa Barbara, CA (US);
Jeff Caron, Orinda, CA (US);
Rohit Jain, Ventura, CA (US);
Thomas Briscoe, Fort Collins, CO (US);
Jesper Lohse, Herlev, DK;
Hans Christian Pedersen, Hillerod, DK;
Joachim Schmid, Santa Barbara, CA (US);
Jeff Caron, Orinda, CA (US);
Rohit Jain, Ventura, CA (US);
Thomas Briscoe, Fort Collins, CO (US);
DAKO DENMARK A/S, Glostrup, DK;
Abstract
Disclosed are methods and systems for analyzing images of specimens processed by a programmable quantitative assay or more specifically a robust programmable quantitative dot assay, PDQA, that enable specimens to be imaged and assessed across a wide variety of conditions and applications. Specific embodiments directed to immunohistochemical applications provide more quantitative methods of imaging and assessing biological samples including tissue samples.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile