The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 15, 2018
Filed:
Aug. 19, 2013
Nec Corporation, Minato-ku, Tokyo, JP;
Shigeki Shinoda, Tokyo, JP;
Yasuhiro Sasaki, Tokyo, JP;
Masatake Takahashi, Tokyo, JP;
Junichiro Mataga, Tokyo, JP;
Soichiro Takata, Tokyo, JP;
NEC CORPORATION, Tokyo, JP;
Abstract
Each functional configuring unit of a leak inspection device () operates in the manner that follows. A vibration acquisition unit () acquires a signal indicating tubing vibrations or vibrations propagated from tubing. A filtering unit () extracts a signal of a predetermined frequency band from the signal acquired by the vibration acquisition unit (). A characteristic value extraction unit () splits the signal extracted by the filtering unit () into predetermined time intervals, calculates for each split signal the absolute value of each extreme value of the magnitude of the signal, performs for each split signal a statistical process with respect to the calculated plurality of absolute values, and considers values calculated by the statistical process to be characteristic values. A leak determination unit () considers inspection results to indicate the presence of a leak when a determination index value stipulated using the characteristic values is greater than a predetermined threshold.